3504-60, 3504-50, 3504-40 C HiTESTER

• C, D (tan δ) testing
• Measure high capacitance MLCC
• BIN function
• Contact check function
• Testing source frequency: 120Hz or 1kHz
• Measuring time: 2msec
• RS-232C, GP-IB

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3505, 3506 C HiTESTER

• C, D (tan δ), Q testing
• Measure low capacitance
• Testing source frequency: 1kHz, 1MHz
• Measuring time: 2msec
• RS-232C, GP-IB

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